Evaluation of the Influence of Gate Dielectric Materials on the Temperature Sensitivity of Silicon Nanowire Transistors. Nigerian Journal of Applied Physics, [S. l.], v. 2, n. 2, p. 246–253, 2026. DOI: 10.62292/njap-v2i2-2026-83. Disponível em: https://njap.nipngr.org/index.php/njap/article/view/83. Acesso em: 11 aug. 2026.